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School of Electrical and Electronic Engineering

Material Characterization

Below are some of the facilities we currenty have available for Material Characterization:

Atomic Force Microscopes

Atomic Force Microscopes

 

 

 

 

 

Photoluminescence Spectra and Mapping

Photoluminescence Spectra and Mapping

 

 

 

 

 

Mercury Prober

Mercury Prober

 

 

 

 

 

Electrochemical CV Profiler

Electrochemical CV Profiler

 

 

 

 

 

Hall Effect Measurements

Hall Effect Measurements

 

 

 

 

 

Bede QC200 DCXRD

Bede QC200 DCXRD

 

 

 

 

 

 

 

 

 

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