[University home]

School of Electrical and Electronic Engineering

Advanced Spectroscopy and Imaging

Deep-level Transient-Spectroscopy equipment
Deep-level Transient-Spectroscopy equipment.

Deep-level Transient-Spectroscopy is the electrical characterisation of deep levels in Silicon and Germanium:electronically active crystal defects which lie more than 100meV from the valence and conduction band edges. The procedure extracts information on electrically active defects not accessible by other means.

Laplace DLTS

Laplace DLTS is the high resolution extension to the DLTS technique developed within the M&N group.  The development team were awarded the National Physical Laboratory (NPL) prize.

Equipment developed at Manchester: