Prof Wuqiang Yang - personal details


Contact details

Prof Wuqiang Yang

Role: Professor of Electronic Instrumentation


Tel: 0161 306-4792

Location: Sackville Street Building-D48
School of Electrical and Electronic Engineering
The University of Manchester
M13 9PL




Professor Wuqiang Yang (FIET, FInstMC, FIEEE, CEng)  received his BEng (Distinction) 1982, MSc 1985 and PhD (Distinction) 1988, from Tsinghua University. After 3 years as a Lecturer at Tsinghua University, he joined UMIST in 1991. His research is focused on electrical capacitance tomography (ECT), has published 300 papers and a book "Sensor Array", and holds 10 patents, including 2 WO patents, which have been licensed to industry. He is an Associate Editor of IEEE Trans. IM and an editorial board member of 7 other journals, including Meas. Sci. Technol. and Sensor Review, and reviews papers for 40 journals, including 6 IEEE journals. He has been invited by many universities and research institutions worldwide and international conferences to give lectures/seminars/keynotes. He is a visiting professor at 8 universities, including Tsinghua University. He is recognised by International Center for Scientific Research (France), as one of top 30 technology researchers in the world, and Intota as an expert. Since 2010, he is an IEEE IMS Distinguished Lecturer

His biography has been included in Who's Who in the World, Who's Who in Science and Eng. and Who's Who in America since 2002. In 2006 he received Global Research Award from the Royal Academy of Eng. and took sabbatical leave at Massachusetts Institute of Technology (MIT) in USA as a visiting professor. He has received many awards, including 1997 IEE/NPL Wheatstone Measurement Prize, 1997 Honeywell Prize from InstMC, 2000 IEE Ayrton Premium, 2008 Outstanding Organization award from IEEE IM Society, 2009 Valued Reviewer from Sensors and Actuators journal, 2009 IET Innovation Award Finalist, and 2010 Outstanding Reviewer from Sensor Review journal. He was an honorary chairman of IEEE Int. Conference on Imaging Systems and Techniques and will be the General Chair of 2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC'2018), which will be held in Manchester. He organised 2 special issues in 2013 for IEEE Trans. IM and Meas. Sci. Technol. as a Guest Editor. He is a panel member of NSFC and a reviewer for 973. He has just been awarded Invitation Fellowship by Japanese Society for the Promotion of Science.


BEng, MSc, PhD (Tsinghua University), FIET, FInstMC, FIEEE, CEng

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